| SCANNING ELECTRON MICROSCOPE
Contact person: Dr. S. Boninelli, simona.boninelli@ct.infn.it
Technician: C. Percolla, carmelo.percolla@imm.cnr.it
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30 kV Field Emission Scanning Electron Microscope, Carl Zeiss SUPRA™ 25 with the following specifications:
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| ATOMIC FORCE MICROSCOPE
Contact person: Prof. F. Ruffino, francesco.ruffino@ct.infn.it
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Bruker INNOVA Atomic Force Microscopy with the following specifications:
- Closed-Loop Scanner: XY > 90 µm, Z > 7.5 µm
- Open-Loop Scanner: XY > 5 µm, Z > 1.5 µm
- Sample size: X-45 mm x Y-45 mm x Z-18 mm
- Motorized Z Axis Stage: Z Travel: 18mm
- Optics: Camera: on-axis color CCD with motorized zoom
- Field of view: 1.25mm - 0.25mm (motorized zoom, with 10x objective)
- Resolution: <2 µm with standard 10x objective (0.75 µm with 50X)
- Electronics: 20-bit DAC control, 100 kHz ±10v ADCs, digital feedback
- System software: SPMLa v7 for data acquisition & analysis
- Equipped to perform conductive measurements
- Typologies of samples: ideal for applications such as surface studies in materials science, characterization of polymers, biomolecules, and semiconductors, and nanomanipulation and nanolithography
Representative papers:
- Applied Surface Science 529 (2020) 147142
- Scientific Reports 8 (2018) 5001
- Superlattices and Microstructures 113 (2018) 430
Access to research institutions and industries extern to CNR: Yes; Free of costs.
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| SCANNING TUNNELLING MICROSCOPE
Contact person: Prof. F. Ruffino, francesco.ruffino@ct.infn.it
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Nanosurf easyScan2 STM with the following specifications:
- Maximum Scan Range: 500 nm
- Maximum Z-Range: 200 nm
- Current set point : 0.1-100 nA in 25 pA steps
- Tip voltage: ± 10 V in 5mV steps
- Tip sample approach: Stick-slip piezo motor
- Sample size: max 10 mm diameter
- Modes of operation: constant current mode and constant height mode
Access to research institutions and industries extern to CNR: Yes; free of costs.
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| PHOTOLUMINESCENCE AND ELECTROLUMINESCENCE
Contact person: Dr. G. Franzò, giorgia.franzo@ct.infn.it
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Home-assembled system for photo- and electro-luminescence measurements on thin films, liquids and powders. It is equipped with different excitation continuum laser sources:
- HeCd (325 nm)
- Ar (different lines in the 457-514.5 nm range)
- Ti-sapphire (tunable In the wavelength range 700-1000 nm) and different devices for the detection of the luminescence signal
- Hamamatsu photomultiplier tube for the UV and visible region
- Infrared extended Hamamatsu photomultiplier
- Ge detector for the near infrared region (from 800 to 1700 nm)
- Hamamatsu InAs detector and Judson Technologies InSb detector for the infrared region (up to 3500 nm and 5500 nm, respectively)
- A system for time-resolved measurements using an acousto-optic modulator to modulate the laser and a Stanford Research multichannel scaler to acquire the signal with a time resolution of about 30 ns
- A system for time-resolved photoluminescence measurements formed by an optical parametric oscillator (OPO) pumped by a ns Nd:YAG laser, a spectrograph with an intensified CCD and a linear InGaAs detector. With this setup it is possible to measure PL spectra by tuning the excitation wavelength in the 200-2000 nm range and to perform time resolved PL measurements with a time resolution of 10 ns
- An Oxford closed cycle He cryostat for low temperature measurements down to 10 K
- Different power supplies (both continuous and pulsed) for electroluminescence measurements
- Best suited (however, not limited to), due to ultra-decennial expertise, for silicon-based photonics
Representative papers:
- Advancde Optical Materials 8 (2020) 2001070
- RSC Advances 6 (2016) 73170
- Applied Physics Express 7 (2014) 012601
Access to research institutions and industries extern to CNR: Yes; Costs to be defined on the basis of amount and type of measurements.
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| UV-VIS SPECTROPHOTEMETER
Contact person: Dr. G. Impellizzeri, giuliana.impellizzeri@ct.infn.it
Technician: G. Panté, giuseppe.Panté@ct.infn.it
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UV-Vis Spectrophotometer LAMBDA 45 (Perkin Elmer) with the following specifications:
- Equipped with an halogen lamp for measurements in the VIS region and a deuterium lamp for measurements in the UV region
- Operates in a range of 190 - 1100 nm with a resolution of ± 0.1 nm
- Spectroscopic Ellipsometry (SE) A
- The bandwidth is in the range of 0.5 - 4 nm, with a speed scan between 7.5 and 2880 nm/min
- Measurements on liquids samples, regulatory tests requiring variable resolution, and highly light-scattering samples
- An additional pre-monochromator reduces stray light by a factor of 2, providing optimum performance for turbid and light-scattering samples, such as some biological solutions and suspensions
- Can operate in scanning mode, wavelength program, time-drive, rate, quant and scanning quant
- It is particularly suited to investigate the photocatalytic properties of nanostructures by the degradation of organic dyes and DNA/RNA analysis, the detection of biomolecules and to evaluate the concentration of bacterial samples
Representative papers:
- Applied Catalysis B 238 (2018) 509
- Chemical Engineering Journal 379 (2020) 122309
- Scientific Reports 9 (2019) 974
Access to research institutions and industries extern to CNR: Yes; Costs (indicative): € 250.
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| IR SPECTROPHOTEMETER
Contact person: Dr. G. Impellizzeri, giuliana.impellizzeri@ct.infn.it
Technician: G. Panté, giuseppe.Panté@ct.infn.it
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Jasco FT-IR 4700 Spectrophotometer with the following specifications:
- Equipped with ATR-IR accessories
- Equipped for specular reflectance measurements
- Equipped for diffused reflectance measurements
Access to research institutions and industries extern to CNR: Yes; Costs (indicative): € 300.
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| SOLAR SIMULATOR
Contact person: Dr. G. Impellizzeri, giuliana.impellizzeri@ct.infn.it
Technician: G. Panté, giuseppe.Panté@ct.infn.it
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Solar simulator ORIEL LSS-7120 (Newport) with the following specifications:
- Maximum irradiance: 100 mW/cm2
- Independent control of the bands
- Inhomogeneity <2%
Representative papers:
- Materials Science in Semiconductor Processing 112 (2020) 105019
- RSC Advances 9 (2019) 30182
Access to research institutions and industries extern to CNR: Yes; Costs (indicative): € 250.
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| UV-LED LAMP
Contact person: Dr. G. Impellizzeri, giuliana.impellizzeri@ct.infn.it
Technician: G. Panté, giuseppe.Panté@ct.infn.it
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UV-LED LAMP (Uwave) with the following specifications:
- Peak centered at 365 nm
- Irradiance can be changed from 15 to 250 mW/cm2
- Inhomogeneity<1.8%
Representative papers:
- ACS Applied Bio Materials 3 (2020) 4417
- Materials Science in Semiconductor Processing 118 (2020) 105214
Access to research institutions and industries extern to CNR: Yes; Costs (indicative): € 230.
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| CONTACT ANGLE MEASUREMENT SYSTEM
Contact person: Dr. G. Impellizzeri, giuliana.impellizzeri@ct.infn.it
Technician: G. Panté, giuseppe.Panté@ct.infn.it
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Optical contact angle measurement system OCA 15PRO (Dataphysics) with the following specifications:
- Sample table can slide freely in X- and Y-direction and is locked into position with its switchable magnetic base
- In Z-direction the sample table is adjustable using precision mechanics with a hand wheel
Representative papers:
- RSC Advances 8 (2018) 521
- Journal of Photochemistry and Photobiology A 332 (2017) 497
Access to research institutions and industries extern to CNR: Yes; Costs (indicative): € 230.
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| SURFACE AREA AND POROSITY ANALYZER
Contact person: Dr. G. Impellizzeri, giuliana.impellizzeri@ct.infn.it
Technician: G. Panté, giuseppe.Panté@ct.infn.it
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Surface area and porosity analyser Tristar II (Micrometrics) with the following specifications:
- Sample need to be in powder form
- Can measure surface areas as low as 0.01 m2/g
- Accommodates analysis with a variety of adsorbates including argon, carbon dioxide, and other noncorrosive gases such as butane, methane, and other light hydrocarbons
Representative papers:
- Chemical Engineering Journal 379 (2020) 122309
- Journal of Photochemistry and Photobiology A 380 (2019) 111872
- Materials Science in Semiconductor Processing 112 (2020) 105019
Access to research institutions and industries extern to CNR: Yes; Costs (indicative): € 350.
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| TOTAL ORGANIC CARBON ANALYZER
Contact person: Dr. G. Impellizzeri, giuliana.impellizzeri@ct.infn.it
Technician: G. Panté, giuseppe.Panté@ct.infn.it
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Total organic carbon analyser TOC LCSH (Shimadzu) with the following specifications:
- Equipped with micro-sampling system for the analysis of small volumes of solution
Representative papers:
- Catalysis Today 321-322 (2019) 146
- Journal of Photochemistry and Photobiology A 380 (2019) 111872
- RSC Advances 9 (2019) 30182
Access to research institutions and industries extern to CNR: Yes; Costs (indicative): € 260.
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| Ellipsometer
Contact person: Dr. G. Impellizzeri, giuliana.impellizzeri@ct.infn.it
Technician: G. Panté, giuseppe.Panté@ct.infn.it
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M-2000 spectroscopic ellipsometer (Woollam) with the following specifications:
- Advanced optical design, wide spectral range, and fast data acquisition
- Measurements cover the spectral range from deep ultraviolet (193 nm) to near infrared (1690 nm)
- The use of a CCD (Charge Coupled Device) detector allows simultaneous measurement of hundreds of wavelengths
- The system is also equipped with an automatic mapping stage, able to automatically mapping films up to 8" in diameter
- It is commonly used to measure thin film thickness and optical constants of materials. It is sensitive to less than a monolayer of material (sub-nm) on a surface
Representative papers:
- Applied Catalysis B 196 (2016) 68
- ACS Applied Bio Materials 3 (2020) 4417
- ACS Applied Materials and Interfaces 10 (2018) 40100
Access to research institutions and industries extern to CNR: Yes; Costs to be defined on the basis of amount and type of measurements.
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| POTENTIOSTAT
Contact person: Prof. S. Mirabella, salvo.mirabella@dfa.unict.it
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PAR Potentiostat with the following specifications:
- Possibility of cyclic voltammetry measurements
- Possibility of electrochemical impedance measurements
- Possibility of stripping voltammetry
- Possibility of coulometry
Representative papers:
- ACS Applied Materials and Interfaces 12 (2020) 50143
- Scientific Reports 9 (2019) 7736
- Materials Advances 1 (2020) 1971
Access to research institutions and industries extern to CNR: Yes; free of costs.
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