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Type: 
Journal
Description: 
In this paper we discuss some major aspects on the physics of the phase transition from the amorphous to the face-centered-cubic (fcc) polycrystal in Ge2Sb2Te5 at low temperature. We follow the phase transformation by using structural techniques such as TEM, XRD, and electrical resistivity measurements by using the 4-point-probe technique. The results are interpreted in the framework of a quantitative model.
Publisher: 
Elsevier
Publication date: 
1 Mar 2010
Authors: 
Biblio References: 
Volume: 87 Issue: 3 Pages: 294-300
Origin: 
Microelectronic Engineering